A Comprehensive Solution to Automated Inspection Device Selection Problems using ELECTRE Methods
Corresponding email: prasenjit2007@gmail.com
Published at : 07 Jul 2014
Volume : IJtech
Vol 5, No 2 (2014)
DOI : https://doi.org/10.14716/ijtech.v5i2.410
Chatterjee, P., Mondal, S., Chakraborty, S., 2014. A Comprehensive Solution to Automated Inspection Device Selection Problems using ELECTRE Methods. International Journal of Technology. Volume 5(2), pp. 193-208
| Prasenjit Chatterjee | Department of Mechanical Engineering, MCKV Institute of Engineering, Liluah, Howrah- 711 204, India |
| Suprakash Mondal | Department of Production Engineering, Mallabhum Institute of Technology, Bishnupur, Bankura- 722 122, India |
| Shankar Chakraborty | Department of Production Engineering, Jadavpur University, KOLKATA- 700 032, India |
Selection of an automated inspection device for an explicit industrial application is one of the most challenging problems in the current manufacturing environment. It has become more and more complicated due to increasing complexity, advanced features and facilities that are endlessly being integrated into the devices by different manufacturers. Selection of inspection devices plays a significant role in a manufacturing system for cost effectiveness and improved productivity. This paper focuses on the application of a very popular Multi-Criteria Decision-Making (MCDM) tool, i.e. ELimination and Et Choice Translating REality (ELECTRE) for solving an automated inspection device selection problem in a discrete manufacturing environment. Using a sample case study from the published literature, this paper attempts to show how different variants of the ELECTRE method, namely ELECTRE II, IS, III, IV and TRI can be suitably applied in choosing the most efficient alternative that accounts for both the decision maker’s intervention and other technical elements. Using different ELECTRE methods, a list of all the possible choices from the best to the worst suitable devices is obtained while taking into account different selection attributes. The ranking performance of these methods is also compared with that of the past researchers.
Automated inspection device selection, Comparative analysis, ELECTRE II, IS, III, IV, TRI, MCDM
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