TY  - JOUR
T1  - A Comprehensive Solution to Automated Inspection Device Selection Problems using ELECTRE Methods
AU  - Prasenjit  Chatterjee,Suprakash  Mondal,Shankar  Chakraborty
JO  - International Journal of Technology
VL  - 5
IS  - 2
SP  - 291
EP  - 319
PY  - 2014
DA  - 2014/07/07
SN  - 2087-2100
DO  - https://doi.org/10.14716/ijtech.v5i2.410
UR  - https://ijtech.eng.ui.ac.id/article/view/1288